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EDXRF

NEX DE Series

High-performance Direct Excitation EDXRF Spectrometers 

Powerful, non-destructive qualitative and quantitative elemental analysis 

The Rigaku NEX DE Series are high-performance, direct excitation EDXRF spectrometers that deliver exceptional elemental analysis capabilities. Utilizing a high-powered X-ray tube, these instruments provide superior analytical performance, including higher count rates, improved precision, and the ability to analyze even challenging materials with ease. This versatility allows the NEX DE Series to address a wide range of applications, from demanding quality control needs to those requiring small spot analysis. The series includes NEX DE and NEX DE VS. 

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NEX DE and NEX DE VS premium high-performance benchtop EDXRF elemental spectrometers

NEX DE Series Overview

Empowering your analysis with high-performance EDXRF 

The NEX DE and NEX DE VS models deliver high-performance results when analysis time or sample throughput is critical. They are designed for speed and precision, important for high-volume analytical labs or fast-paced settings. 

They have a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a high-performance silicon drift detector (SDD) that supports count rates over 500K cps. The high-count rates provide low limits of detection and excellent spectral resolution, and high-throughput measurements are obtained with various interchangeable automatic sample changers. These features enable high-precision analytical results in the shortest possible measurement times.  

Additionally, these instruments are packaged with QuantEZ software designed to simplify method development and maximize your time. The intuitive instrument control, simple menu navigation, and EZ Analysis interface streamline routine operations and allow you to create new methods using a simple flow bar wizard. These systems are well-suited for exploration, research, bulk RoHS inspection, education, forensics, and industrial and production monitoring applications. 

Small spot EDXRF measurements 

For your small spot analysis needs, the NEX DE VS model features a high-resolution camera and automated collimators to allow for precise positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes. The instrument’s large sample chamber accommodates samples up to 30 cm in diameter and 10 cm tall, and the Point Analysis interface and integrated backlit camera allow easy sample positioning. NEX DE VS is an excellent option for measuring coatings on smaller parts, screening small samples for electronic waste initiatives, or investigating the identification of foreign matter of unknown composition. 

NEX DE Series Features

Rapid, non-destructive elemental analysis
Multi-element capabilities, from ppm to percent levels
Measurement of all elements from sodium (Na) to uranium (U)
Multi-application versatility, including solids, liquids, alloys, powders, and thin films
60 kV X-ray tube for wide elemental coverage
High-performance SDD for superior data
Small spot analysis, 1 mm, 3 mm, and 10 mm (NEX DE VS model)
Powerful, easy-to-use QuantEZ software with multilingual user interface
Multiple automated tube filters for enhanced sensitivity
Advanced RPF-SQX Fundamental Parameters software featuring Rigaku Scattering FP
Low cost of ownership, self-installed and maintained
See Specifications for options

NEX DE Series Videos

NEX DE Series Specifications

Technique Direct excitation energy dispersive X-ray fluorescence (EDXRF)
Benefit High-performance EDXRF systems offering enhanced sensitivity, speed, and flexibility

Small spot analysis capabilities using high-resolution camera, automatic collimators, and user-friendly Point Analysis screen (NEX DE VS)
Technology EDXRF using a high-performance silicon drift detector (SDD)
Attributes 60 kV 12 W X-ray tube, high-performance SDD, analyze Na to U
Software QuantEZ for control of spectrometer functions and data analysis
Options Vacuum (NEX DE model), helium purge, automatic sample changers, single-position sample spinner, external PC with Microsoft Windows operating system, UPS, RPF-SQX Fundamental Parameters with Rigaku Scattering FP, SureDI support for 21 CFR Part 11 compliance, other software features
Dimensions 356 (W) x 260 (H) x 351 (D) mm
Mass Approx. 27 kg (core unit)
Power requirements 1Ø, 100 – 240 V, 1.5 A (50/60 Hz)
Warranty 2 years

NEX DE Series Application Notes

The following application notes apply to these products. Application notes using the NEX DE spectrometer can also be performed using the NEX DE VS model

NEX DE Series Resources

Webinars

A Non-Destructive XRF Technique for Rapid and Easy Screening of Residual Catalysts in APIs and Intermediates Watch the Recording
The Use of Easy XRF Elemental Analyses Techniques to Support the Development of Pharmaceutical Formulations Watch the Recording
Quality control of API potency, excipient blend uniformity, and heavy metals impurities by non-destructive and direct analysis of intact pills by XRF Watch the Recording

Rigaku Journal articles

adobeForeign material analysis using energy dispersive X-ray fluorescence spectrometers Read the Article
adobeX-ray fluorescence analysis of halogen elements Read the Article

NEX DE Series Events

Learn more about our products at these events

  • 79th STLE Annual Meeting & Exhibition
    May 17 2025 - May 21 2025
    Atlanta, GA
    Website
  • Gulf Coast Conference 2025
    October 13 2025 - October 14 2025
    Galveston, TX, United States
    Website
  • Labelexpo Americas 2026
    September 14 2026 - September 16 2026
    Chicago, IL
    Website

NEX DE Series Training

Upcoming training sessions

  • EDXRF Operator Training (USA)
    July 14 2025 - July 15 2025
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.
    Class outline
    Registration form
  • EDXRF Operator Training (USA)
    September 15 2025 - September 16 2025
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.
    Class outline
    Registration form
  • EDXRF Operator Training (USA)
    November 10 2025 - November 11 2025
    Please contact info@RigakuEDXRF.com
    Cedar Park, Texas
    Get hands-on training for NEX benchtop analyzers. Through direct experience, you will gain knowledge and skills in instrument calibration, method development, easy sample preparation techniques, and software operation.
    Class outline
    Registration form

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