SMARTLAB STUDIO II SOFTWARE

SOFTWARE SUITE FOR RIGAKU X-RAY DIFFRACTOMETERS 

Integrated Windows®-based software suite brining together data collection, analysis,  visualization and reporting, along with FDA 21 CFR part 11 compliance.

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SmartLab Studio II is a new Windows®-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components. Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc. 

Software Suite Rigaku XRD

COMMON FEATURES 

  • Seamless operations from measurement to reporting by a single software platform 
  • It covers basic XRPD applications, e.g. qualitative, quantitative, crystallite size, Rietveld analysis, as well as advanced analysis, e.g. Component Analysis, Indexing, Clustering, and PDF. 
  • Clustering analysis and Data Visualization supports various data treatments 
  • Support FDA 21 CFR Part 11 data integrity 
  • Network dongle provides software licenses maximum of 10 PCs 

XRD MEASUREMENT PLUGIN 

  • User Guidance guides instrument operation for beginners and experts 
  • Wizard recommends measurement conditions to users depending on sample types 
  • One-click operation from measurement to analysis if defined 
  • Measurement and analysis on 0-, 1- and 2-D data 
  • In-situ and operando measurements support synchronizing with an external device 

POWDER XRD PLUGIN 

  • Unified interface from qualitative analysis to structure determination 
  • Direct Derivation (DD) method for standard less quantification of mixed crystalline and amorphous samples.
  • Whole powder pattern fitting (WPPF) based on Fundamental Parameters (FP) approach 
  • Direct phase identification from 2-D data utilizing crystallite size information 

MRSAXS PLUGIN 

  • Particle size and distribution analysis from 1-D or 2-D SAXS data 
  • Size distribution, average, percentile D10, D50, D90 are calculated 
  • Sample that does not transmit visible light can be analyzed 
  • Analyze on sample with multiple particle size distributions 

PDF PLUGIN 

  • Calculation of structure function S(Q) and pair distribution function (PDF) 
  • Overlay calculated atomic distances from crystal structure on PDF data 
  • PDF calculation from multiple data measured by different X-ray wavelengths
  • Reasonable S(Q) and PDF profiles using ripple and damping correction 
  • Exporting PDF profile to PDFgui and RMCProfile software 

DATA VISUALIZATION PLUGIN 

  • Analyze and display of multiple data 
  • • 1-D data waterfall plot 
  • • 2-D & 1-D data slideshow 
  • in-situ and operando data treatment and representation 
  • Temperature vs. XRD, Differential Scanning Calorimetry (DSC) profile vs. XRD data representation 
  • Importing & linking data from an external device, e.g. potentiometer with XRD data 
  • Spatial mapping data analysis and representation overlayed with sample snap-shot image 
  • Extracting data from selected point or area on a spatial mapping data 
  • Synchronization with analysis software plugins, e.g. PowderXRD, Stress, XRR and HRXRD, to analyze multiple data 
  • Displaying analyzed results by analysis software plugin, e.g. phase, stress, thickness, together with spatial mapping data and snap-shot sample image 
  • Statistical calculation of analyzed results by analysis software plugin over an area mapped 

XRD-DSC PLUGIN 

  • Representing Differential Scanning Calorimetry (DSC) and XRD profiles against time and temperature 
  • Analysis of DSC profile, e.g. starting temperature of exo- and endothermic reactions, energies absorbed and released 
  • Visualize crystallographic phase change as a function of time and/or temperature

POWDER XRD: PHASE IDENTIFICATION WITH A VARIETY OF AVAILABLE DATABASES 

Peak position, FWHM, integrated intensity and crystallite size are calculated by profile fitting. Rigaku’s optional “Hybrid Search/Match” uses peak-base qualification, which detects heavily distorted lattices, to identify solid solution phases that are difficult to identify. It also can determine whether preferred orientation exists based on decomposed peak intensities. 

Powder XRD Phase Identification with Databases

POWDER XRD: QUANTIFICATION PACKAGE 

This option supports internal standard, external standard, and standard addition calibration methods. Calibration curves are used to quantify specific phases in the sample. 

Powder XRD Quantification Package

POWDER XRD: COMPREHENSIVE ANALYSIS PACKAGE 

This optional package can provide analysis results such as crystalline size, lattice strain, lattice parameters refinement, % crystallinity based on fully automated profile fitting executed after loading measured data. Results obtained aid in understanding the relationship between structure and physical properties, and allow users to compare results across different samples.

Powder XRD Comprehensive Analysis Package

 

POWDER XRD: DIRECT DERIVATION ANALYSIS PACKAGE 

The direct derivation (DD) method was invented by Professor Hideo Toraya of Rigaku Corporation in 2016. It quantifies phases from all integrated diffraction intensities and the chemical formulas of each phase found. Compared to the classical RIR method, where a single integrated peak intensity and RIR number are used, the DD method is less affected by preferred orientation and peak overlap.

Powder XRD Direct Derivation Analysis Package

 

POWDER XRD: RIETVELD ANALYSIS PACKAGE 

The package performs phase identification followed by Whole Powder Pattern Fitting (WPPF). The Rietveld analysis refines crystal structure or quantifies the phases directly from measured data, requiring neither reference samples nor a calibration curve. The whole powder pattern decomposition (Pawley method) is based on both the measured peak positions, and peak shapes.

Powder XRD Reitveld Analysis Package